Sample preparation equipment (mostly for SEM) comprising conductive sputter coating units, ion mill polishing unit and evaporation units located in WH153.
An ex-situ lift out system (EXpressLO LLC) is available for advanced TEM sample preparation in WH172B, this allows a thin sample to be placed accurately on a special substrate.
The NanoMill (Fischione) is used following FIB sample preparation (TEM) and is located in WH172F.
![](/sites/ifmd.lehigh.edu/files/images/card/ion-mill-17he2zv-300x225.png)
Ion Mill System
![](/sites/ifmd.lehigh.edu/files/images/card/ir-coating-xrinly-300x225.png)
Coating units
![](/sites/ifmd.lehigh.edu/files/images/card/evaporators-1lct9qh-300x225.png)
Evaporators
![](/sites/ifmd.lehigh.edu/files/images/card/nanomill-1xmxubg-e1534360858271-300x248.png)