Banner for 50+ Years of Lehigh Microscopy School

Welcome to the Lehigh Microscopy School

Celebrating Over 50 Years of Excellence with the World's Best Microscopy Courses

We are excited to offer an expanded list of courses for the 2024 Lehigh Microscopy School,
including SEM, TEM, FIB, and X-Ray Microanalysis courses.

From June 2nd to June 7th, 2024, the Lehigh Microscopy School will once again open its doors to
passionate participants eager to delve into the intricacies of electron microscopy. The program 
will focus on the fundamental techniques of Scanning Electron Microscopy (SEM) and X-Ray Microanalysis (EDS).

There will also be specialized courses, including Transmission Electron Microscopy (TEM), Focused
Ion Beam (FIB), Problem Solving and Analysis of SEM/EDS/EBSD results, and 
Quantitative X-Ray Microanalysis using EDS and WDS techniques.

We also offer introductory SEM and TEM courses for new operators.

We can hardly wait for Lehigh Microscopy School 2024, and we hope to see you there!



Best regards,
Dr. Christopher J. Kiely
Harold B. Chambers Senior Professor of Materials Science and Engineering
Lehigh University
LMS Director

Dr. Masashi Watanabe
Professor of Materials Science and Engineering
Lehigh University
LMS Co-director

For more information and the latest updates, follow the Lehigh Microscopy School on LinkedIn.

For further information contact:

Carolyn Law
Lehigh Microscopy School
5 East Packer Avenue
Bethlehem, PA 18015
Phone: 610-758-1112

Email for Further Information