As a participant you will receive your own copy of one of the textbooks authored by the course lecturers:
- Scanning Electron Microscopy and X-ray Microanalysis, 4th edition (2018), Kluwer/Springer Publishers, New York
- Transmission Electron Microscopy: A Textbook for Materials Science, 2nd Edition (2009), Kluwer/Springer Publishers, New York
- Introduction to Focused Ion Beam: Instrumentation, Theory, Techniques, and Practice (2005) (eds. L.A. Giannuzzi and F. A. Stevie) Springer, New York
- Electron Microprobe Analysis, 2nd Edition (1997), S.J.B. Reed, Cambridge University Press
In addition, you will receive:
- A link to a website containing exclusive imaging and analysis software
- A notebook containing course notes of PowerPoint slides presented by the lecturers and a laboratory workbook authored by the course lecturers