I-FMD hosts XPS Symposium sponsored by Thermo Fisher Scientific

Lehigh's Institute for Functional Materials and Devices hosted a workshop on April 8, 2025 on X-ray photoelectron spectroscopy (XPS) techniques. This event was organized by Dr. Ryan Thorpe, Surface Science Manager for I-FMD, and was generously sponsored by Thermo Fisher Scientific. The full day event kicked off with an overview of Lehigh's Materials Characterization facility, including I-FMD's near-ambient pressure XPS (NAP-XPS), which is a unique capability that is only available at a handful of institutions. The keynote presentation of the event was delivered by Dr. James Lallo, Surface Analysis Product Marketing Engineer for ThermoFisher Scientific. Dr. Lallo highlighted the power of XPS for providing elemental detection of surface materials with surface selectivity not capable by any other analytical techniques. He also introduced Thermo Fisher's new Correlated Imaging for Surface Analysis (CISA) workflow, which combines the capabilities of XPS with Scanning Electron Microscopy/Energy Dispersive X-ray Spectroscopy (SEM/EDS), providing holistic understanding of the elemental composition of materials samples. During the afternoon, Lehigh graduate and undergraduate students who use I-FMD's XPS in their own research presented lighting talks to the assembled audience. The event concluded with a facilities tour.

I-FMDs NAP-XPS instrument, like all instrumentation in our Materials Characterization Facility is available to all internal Lehigh users as well as external partners. Please reach out to us at inifmd@lehigh.edu if you would like to learn more about becoming a user of these facilities.