Electron Microscopy Facility

Rates from July 1, 2019

Instruments Lehigh Internal User Academic* Commercial*
$/hr or $/use   (Univ. & Govt.) (Inst. Only)
       
JEOL 8900 Probe $35 $56

$157.5

FEI XL30 SEM $35 $56 $157.5
Zeiss 1550VP SEM $45 $72 $202.5
Hitachi 4300 SEM $45 $72 $202.5
FEI SCIOS FIB $55 $89 $247.5
JE0L 2100 TEM $45 $72 $202.5
JEOL ARM (S)TEM $65 $105 $292.5
       
Fischione Nanomill $50 $81 $225
Coaters $5 $8 $22.5
Electropolishing $5 $8 $22.5
Hitachi ion mill $10 $16 $45

Plus Labor Estimated $90.00 per hour

    

Surface Science Facility

Rates effective October 1st, 2021

Instruments Lehigh Internal User Academic* Commercial*
$/hr   (Univ. & Govt.) (Inst. Only)
       
SPECS UHV XPS unassisted $15 $24 N/A
SPECS UHV XPS assisted $45 $72 $325
SPECS NAP XPS unassisted N/A N/A N/A
SPECS NAP XPS assisted $50 $80 $495
ION-TOF LEIS unassisted $45 $72 N/A
ION-TOF LEIS assisted $75 $120 $395

Additional data analysis $115.00 per hour

    

Nanofabrication Facility

Rates effective July 1st, 2023

Facility usage rate Lehigh Internal User Academic* Commercial*
$/hr   (Univ. & Govt.) (Inst. Only)
       
  $20 $40 $100

Additional charges for precious metals and specialty chemicals may also be added.  Please contact I-FMD staff for details.

 

 

*rates include a 12.5% indirect cost fee on all charges