This course provides a basic introduction to the SEM instrument, specimen preparation methods, electron-beam interactions, imaging and EDS X-ray microanalysis. It is designed for students who have not previously had hands-on experience of SEM or EDS analysis. It is also a good primer course for less experienced individuals to 'get up to speed' before attending the main SEM course.
A one-day course with lectures and labs related to the basic operation of the SEM.
Enrollment will be limited to 24 participants who are also attending the main SEM course beginning on Monday. Attendance would benefit those who are just starting SEM or those who, despite some experience, feel that they lack a grasp of the basic ideas.