The Lehigh Microscopy School is supported by the suppliers of the following software that is used in the School:
- MeX (3D image analysis) Demo
- NIST DTSA II (Desktop Spectrum Analyzer)
- NISTZAF and TRYZAF (Quantitative Electron Probe Microanalysis Data Correction Software) , John Armstrong (email: AaesJTA@aol.com)
- SRIM (Ion Penetration Simulation)
- Win Xray (X-ray Analysis)
- CASINO (Monte Carlo)
- NIH Image J (Image Processing)
- CalcZAF (EPMA calculation and modeling utility)