Scanning Electron Microscopy and X-ray Microanalysis
Our premier, internationally recognized five-day short course combining basic principles, modern instrumentation, and advanced quantitative capabilities.
Options for special interests on Thursday and Friday
As described in our brochure, we offer optional lectures and labs about specific areas of interest. Our three optional sequences are: X-ray Analysis (X), Imaging Techniques (I), and Applications (A). Our sequence on applications addresses topics such as forensic science, polymers, microelectronics, food materials, and failure analysis. Lecture notes for all options are on the flash drive you were given at registration. The chart below will help you to decide which option is best for you. Yes, you can mix and match, but you should note that some sessions in each option build upon previous sessions. Please choose one lab or lecture per time slot.
| Time | Session / Title | Room | Lecturer / Staff |
|---|---|---|---|
| Morning Session | |||
| 8:30-8:45 | Welcome and Announcements | 303 | Watanabe |
| 8:45-9:15 | Lecture Introduction to SEM and X-Ray Microanalysis | 303 | J.H. Scott |
| 9:15-9:30 | Lecture Course Roadmap | 303 | J.H. Scott |
| 9:30-10:30 | Lecture SEM Imaging Modes | 303 | Watanabe |
| 10:30-10:50 | Break | — | — |
| 10:50-12:00 | Lecture Electron Sources, Electron Lenses and Probe Formation | 303 | Kiely (Chris) |
| Afternoon Session | |||
| Groups 1-6* 1:15-2:30 (2:30-2:45 Break) 2:45-4:00 | Lab Lab 1: SEM Imaging Modes Each group on a different SEM (see blue sheets for SEM location) | — | Chan, Kiely (Chris), Kundu, Mansfield, Marvel, Mills |
| Groups 7-12* 1:15-2:45 (2:45-3:00 Break) 3:00-4:00 | Lecture Electron Beam-Specimen Interactions Lecture Generation of X-ray Signals | 303 | J.H. Scott |
| All Groups 4:15-5:15 | Lecture Control of Specimen Charging | 303 | Thiel |
* Your lab group number is on your nametag and on the yellow sheet in your notebook. NOTE: Student samples will be collected this evening and Tuesday evening (6:15-7:00pm) in Whitaker Lab lobby. | |||
| Evening Session | |||
| 6:15-7:00 | Student Sample Submission and Discussion (optional) | 303 Lobby | Mushock, D.Carpenter |
| Groups 1-6 7:00-8:15 (8:15-8:30 Break) 8:30-9:30 | Lecture Electron Beam-Specimen Interactions (7:00-8:15) Lecture Generation of X-ray Signals (8:30-9:30) | 303 | J.H. Scott |
| Groups 7-12 7:00-8:15 (8:15-8:30 Break) 8:30-9:45 | Lab Lab 1: SEM Imaging Modes Each group on a different SEM (see blue sheets for SEM location) | — | Chan, Kiely (Chris), Kundu, Mansfield, Marvel, Mills |
| Time | Session / Title | Room | Lecturer / Staff |
|---|---|---|---|
| Morning Session | |||
| 8:30-10:00 | Lecture Image Formation and Interpretation | 303 | Mansfield |
| 10:00-10:30 | Break | — | — |
NOTE: Student Samples will be collected in the lobby this evening (6:15-7:00 p.m.). NOTE: Sign-up Sheets for use of equipment will be in the lobby today. | |||
| 10:30-12:00 | Lecture Image Contrast in the SEM | 303 | Michael |
| Afternoon Session | |||
| Groups 1-6 1:15-1:25 | Lecture Roadmap Update | 303 | J.H. Scott |
| 1:25-2:40 | Lecture X-ray Detectors (EDS) | 303 | Ritchie |
| 2:40-3:00 | Break (Groups 1-6) | — | — |
| 3:00-4:00 | Lecture Qualitative X-Ray Microanalysis (EDS) | 303 | Thiel |
| Groups 7-12 1:15-2:30 (2:30-2:45 Break) 2:45-4:00 | Lab Lab 2: Image Contrast and Quality + Stereomicroscopy demo (see blue sheets for SEM location) | — | Chan, Kiely (Chris), Kiely (Carol), Kundu, Mansfield, Marvel, Mills |
| All Groups 4:15-5:15 | Lecture Types of Electron Detectors | 303 | Mansfield |
| Evening Session | |||
| 6:15-7:00 | Student Sample Submission and Discussion (optional) | 303 Lobby | Mushock, D.Carpenter |
| Groups 1-6 7:00-8:15 (8:15-8:30 Break) 8:30-9:45 | Lab Lab 2: Image Contrast and Quality + stereomicroscopy demo (continues 8:30-9:45) | — | Chan, Kiely (Chris), Kiely (Carol), Kundu, Mansfield, Marvel, Mills |
| Groups 7-12 7:00-7:10 7:10-8:25 (8:25-8:45 Break) 8:45-9:45 | Lecture Roadmap Update (7:00-7:10) Lecture X-ray Detectors (EDS) (7:10-8:25) Lecture Qualitative X-ray Analysis (EDS) (8:45-9:45) | 303 | J.H. Scott Ritchie Thiel |
| Time | Session / Title | Room | Lecturer / Staff |
|---|---|---|---|
| Morning Session | |||
| 8:30-9:30 | Lecture Digital Imaging and X-Ray Mapping | 303 | Watanabe |
| 9:30-10:00 | Lecture Lehigh Microscopy School Software Exploration | 303 | Watanabe |
| 10:00-10:15 | Break | — | — |
| 10:15-10:35 | Lecture Roadmap Update | 303 | J.H. Scott |
| 10:35-12:00 | Lecture Quantitative X-ray Analysis: The Basics | 303 | Ritchie |
| Afternoon Session | |||
| Groups 1-6 1:15-3:00 (3:00-3:15 Break) 3:15-5:00 | Lab Lab 3: EDS Detectors and X-ray Spectra (1:15-3:00) (see blue sheets for SEM location) Lecture EDS Software (3:15-5:00) | Various 303 | Kundu, Mansfield, Marvel, J.H. Scott, Thiel, Watanabe Ritchie |
| Groups 7-12 1:15-3:00 (3:00-3:15 Break) 3:15-5:00 | Lecture EDS Software (1:15-3:00) Lab Lab 3: EDS Detectors and X-ray Spectra (3:15-5:00) (see blue sheets for SEM location) | 303 Various | Ritchie Kundu, Mansfield, Marvel, J.H. Scott, Thiel, Watanabe |
| Evening Events | |||
| 6:00 | Cocktail Hour | Hotel Bethlehem | — |
| 7:00 | Course Banquet | Hotel Bethlehem | — |
| Time | Session / Title | Room | Lecturer / Staff |
|---|---|---|---|
| Morning Session | |||
| 8:30-9:30 | Lecture High Resolution in the SEM | 303 | Michael |
| 9:30-10:15 | Lecture Stereomicroscopy | 303 | Kiely (Carol) |
| 10:15-10:30 | Break | — | — |
| 10:30-11:15 | Lecture Low-Voltage SEM and Microanalysis | 303 | Michael |
| 11:15-12:00 | Lecture Environmental SEM and Variable Pressure SEM | 303 | Mansfield |
| Afternoon Electives (Choose One Per Time Slot) | |||
| 1:15-2:30 (Choose One) | 1. X-ray Microanalysis in the Variable Pressure SEM and ESEM (X) 2. Lab: Small Scale Mechanical Testing in the SEM (A) 3. Lab: Paired sessions on SEM with student samples (sign up) | 303 HST028 — | J.H. Scott Hintsala Staff |
| 2:30-2:45 | Break | — | — |
| 2:45-4:00 (Choose One) | 1. SEM Maintenance (X, I, A) 2. An Introduction to Electron Backscatter Diffraction (EBSD) in the SEM (X, I, A) 3. Lab: Small-Scale Mechanical Testing in the SEM (A) 4. Lab: Paired sessions on SEM with student samples (sign up) | 207 203 HST028 — | D. Carpenter Michael Hintsala Staff |
| 4:00-5:15 (Choose One) | 1. Sample Preparation for SEM (X, I, A) 2. Characterization of Electronic Materials and Devices (I, A) 3. Lab: Variable Pressure SEM (X, I, A) [Thermo Axia] [Tescan VEGA] 4. Lab: Paired sessions on SEM with student samples (sign up) | 207 303 172F 122 — | Hall Thiel J.H. Scott Mansfield Staff |
| Evening Electives | |||
| 7:00-8:15 (Choose One) | 1. SEM-EDS X-ray Microanalysis in Special Situations: Thin Films, Rough Specimens, and Particles (X, A) 2. An Introduction to Electron Backscatter Diffraction (EBSD) in the SEM (X, I, A) 3. Lab: Analysis of Electronic Materials and Devices (I, A) [JEOL IT210] 4. Lab: Paired sessions on SEM with student samples (sign up) | 303 271 121 — | Ritchie Michael Thiel Staff |
| 8:15-8:30 | Break | — | — |
| 8:30-9:30 (Choose One) | 1. SEM of Polymers 2. Practical Spectrum Simulation (DTSA-II) (X) 3. Lab: Low-Voltage SEM (I, A) [Thermo Axia] [Tescan VEGA] 4. Lab: Paired sessions on SEM with student samples (sign up) | 271 303/257 172F 122 — | Thiel Ritchie J.H. Scott Mansfield Staff |
| Time | Session / Title | Room | Lecturer / Staff |
|---|---|---|---|
| Morning Electives (Choose One Per Time Slot) | |||
| 8:30-9:30 (Choose One) | 1. The EDS Microanalysis Process: Preparing the Analytical Report 2. Lab: EBSD (X, I) [Helios PFIB/Bruker] [Scios FIB/EDAX] 3. Lab: Paired sessions on SEM with student samples (sign up) | 303 HST 028 172B — | Ritchie Michael/Kundu Staff |
| 9:30-9:45 | Break | — | — |
| 9:45-10:45 (Choose One) | 1. Course Summary: Strategies for Practical Microscopy and Microanalysis 2. SEM Analysis of Fracture Surfaces (I, A) 3. Lab: Paired sessions on SEM with student samples (sign up) | 303 207 — | J.H. Scott Hertzberg Staff |
| 10:45-11:00 | Break | — | — |
| 11:00-12:00 (Choose One) | 1. Course Summary: Strategies for Practical Microscopy and Microanalysis 2. SEM Maintenance 3. Lab: Paired sessions on SEM with student samples (sign up) | 303 271 — | J.H. Scott D. Carpenter Staff |
| Afternoon Session | |||
| 1:15-2:15 (Choose One) | 1. Failure Analysis in the SEM (X, I, A) 2. Lab: EBSD (X, I) [Helios PFIB/Bruker] [Scios FIB/EDAX] 3. Lab: Paired sessions on SEM with student samples (sign up) | 303 HST 028 172E — | Hertzberg Michael/Kundu Staff |