Operating between 40 & 120 kV, the undergraduate TEM (JEOL JEM1200EX) is located in WH154 and is reserved for teaching classes in Materials Science and Biological Sciences; it is not intended for graduate research or external contract work.
The instrument incorporates a high take-off angle X-ray detector (PGT EDS) and scanning transmission (STEM) modes of operation (including X-ray mapping, secondary electron and transmitted electron imaging). A CCD camera (AMT) captures wide-angle TEM images and diffraction patterns above the viewing screen. Typically introductory diffraction and imaging techniques are taught along with elementary X-ray analytical methods.
- Tungsten filament
- Twin specimen holder (holds two samples) and low atomic number double tilt analytical holder (Gatan)
- Instrument used for training users of more advanced TEMs.
Contact: Rob Keyse