Teaching TEM

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Operating between 40 & 120 kV, the undergraduate TEM (JEOL JEM1200EX) is located in WH154 and is reserved for teaching classes in Materials Science and Biological Sciences; it is not intended for graduate research or external contract work.

 

The instrument incorporates a high take-off angle X-ray detector (PGT EDS) and scanning transmission (STEM) modes of operation (including X-ray mapping, secondary electron and transmitted electron imaging).  A CCD camera (AMT) captures wide-angle TEM images and diffraction patterns above the viewing screen.  Typically introductory diffraction and imaging techniques are taught along with elementary X-ray analytical methods.

  • Tungsten filament
  • Twin specimen holder (holds two samples) and low atomic number double tilt analytical holder (Gatan)
  • Instrument used for training users of more advanced TEMs.

 


Bright field image – stainless steel at 2-beam condition


Weak beam dark field image – thickness contours

Contact: Rob Keyse