Monday, June 3 |
Time |
Event |
Room |
Instructor |
Morning |
8:30-8:45 |
Welcome and Announcements |
303 |
Kiely (Chris) |
8:45-9:15 |
"The SEM and Electron Probe Microanalyzer: An Introduction" |
303 |
J.H. Scott |
9:15-9:30 |
Course Roadmap |
303 |
J.H. Scott |
9:30-10:30 |
SEM Imaging Modes |
303 |
Lyman |
10:30-10:50 |
Break |
|
|
10:50-12:00 |
"Electron Sources, Electron Lenses and Probe Formation" |
303 |
Kiely (Chris) |
|
Afternoon |
1:15:4:00 |
*SEE GROUP SCHEDULE* |
|
|
4:15-5:15 |
Elimination of Specimen Charging |
303 |
Thiel |
|
|
|
|
Evening |
6:15-7:00 |
"Optional Informal Discussions on Specimen Preparation (student samples collected)" |
303 Lobby |
Oshel/Mushock |
7:00-9:30 |
*SEE GROUP SCHEDULE* (lab group number is on your nametag) |
|
|
|
|
|
|
Tuesday, June 4 |
Time |
Event |
Room |
Instructor |
Morning |
8:30-10:00 |
Image Formation |
303 |
Newbury |
10:00-10:30 |
Break |
|
|
10:30-12:00 |
Image Contrast |
303 |
Michael |
|
|
|
|
Afternoon |
|
|
|
1:15-4:00 |
*SEE GROUP SCHEDULE* |
|
|
4:15-5:15 |
Types of Electron Detectors |
303 |
Mansfield |
|
|
|
|
Evening |
|
|
|
6:15-7:00 |
"Optional Informal Discussions on Specimen Preparation (student samples collected)" |
303 Lobby |
Oshel/Mushock |
7:00-9:45 |
*SEE GROUP SCHEDULE* |
|
|
|
|
|
|
Wednesday, June 5 |
Time |
Event |
Room |
Instructor |
Morning |
8:30-9:30 |
Digital Imaging and Compositional Imaging |
303 |
Lyman |
9:30-10:00 |
How to use the Lehigh Web-based Software |
303 |
Watanabe |
10:00-10:15 |
Break |
|
|
10:15-10:35 |
Roadmap Update |
303 |
J.H.Scott |
10:35-12:00 |
Quantitative X-ray Analysis: The Basics |
303 |
J.H.Scott |
|
|
|
|
Afternoon |
1:15-5:00 |
*SEE GROUP SCHEDULE* |
|
|
|
|
|
|
Evening |
6:30 |
Cocktail Hour - Faculty Lounge, University Center |
|
|
7:30 |
Course Banquet - Faculty Dining Room, University Center |
|
|
|
|
|
|
Thursday, June 6 |
Time |
Event |
Room |
Instructor |
Morning |
8:30-9:30 |
High Resolution SEM |
303 |
Michael |
9:30-10:15 |
Stereomicroscopy |
303 |
Kiely (Carol) |
10:15-10:30 |
Break |
|
|
10:30-11:15 |
Low-Voltage SEM and Microanalysis |
303 |
Michael |
11:15-12:00 |
Variable Pressure and Environmental SEM |
303 |
Mansfield |
|
|
|
|
Afternoon (CHOICE) |
1:15-2:30 |
1. Characterization of Electronic Materials and Devices |
203 |
Thiel |
|
2. Forensic Specimen Preparation (A, I) |
303 |
Platek |
|
3. X-ray Microanalysis in the Variable/Enivro SEM (X) |
207 |
Newbury |
|
4. Lab: Paired sessions on SEM with student samples (sign up) |
|
staff |
|
|
|
|
2:30-2:45 |
Break |
|
|
|
|
|
|
2:45-4:00 |
1. Basic SEM Maintenance (X, I, A) |
207 |
Mushock |
|
2. SEM Specimen Preparation (X, I, A) |
203 |
Oshel |
|
3. Microscopic World of Lunar Dust (X, I, A) |
303 |
Kiely (Carol) |
|
4. Practical Spectrum Simulation (DTSA-II) (x) |
257 |
Ritchie |
|
5. Lab: Small-Scale Mechanical Testing in the SEM (A) |
178 |
Hysitron |
|
6. Lab: Paired sessions on SEM with student samples (sign up) |
|
staff |
|
|
|
|
4:00-5:15 |
1. Lab: Variable Pressure SEM (X, I, A) |
|
|
|
[Hitachi SU-3900N] |
159 |
J. H. Scott |
|
[Tescan VEGA XMII] |
122 |
Mansfield |
|
2. Forensic Specimen Imaging and Microanalysis (I, A) |
303 |
Platek |
|
3. SEM Specimen Preparation (X, I, A) |
203 |
Oshel |
|
4. Basic SEM Maintenance (X, I, A) |
207 |
Mushock |
|
5. Wavelength-Dispersive X-ray Spectrometry |
257 |
Lyman |
|
6. Lab: Paired sessions on SEM or EPMA with student samples (sign up) |
|
Staff |
|
|
|
|
Evening (CHOICE) |
7:00-8:15 |
1. X-ray Analysis in Special Situations: Thin Films, Rough Specimens, and Particles (X, A) |
303 |
Newbury |
|
2. An Introduction to EBSD in SEM |
207 |
Michael |
|
3. Focused Ion Beam Applications (X, I, A) |
203 |
Keyse |
|
4. Lab: SEM of Electronic Materials (I, A) [JEOL IT100LA] |
121 |
Thiel |
|
5. Lab: Wavelength Dispersive Spectrometry (X) [JEOL 8900/Probe for EPMA] |
158 |
Lyman/Mushock |
|
6. Lab: Specimen Preparation for SEM (X, I, A) |
247/153 |
Oshel |
|
7. Lab: Paired sessions on SEM with student samples (sign up) |
|
Staff |
|
|
|
|
8:15-9:30 |
1. SEM of Polymers |
207 |
Thiel |
|
2. Microscopic World of Lunar Dust (X, I, A) |
303 |
Kiely (Carol) |
|
3. Lab: Wavelength Dispersive Spectrometry (X) [JEOL 8900/ Probe for EPMA] |
158 |
Lyman/Mushock |
|
4. Lab: Low-Voltage SEM (I, A) |
|
|
|
[Hitachi 3900] |
159 |
J.H. Scott |
|
[TESCAN VEGA 3] |
122 |
Mansfield |
|
5. Lab: Specimen Preparation for SEM (X, I, A) |
247/153 |
Oshel |
|
6. Lab: Paired sessions on SEM with student samples (sign up) |
|
staff |
|
|
|
|
Friday, June 7 |
Morning (Choice) |
Time |
Event |
Room |
Instructor |
8:30-9:30 |
1. The EDS Microanalysis Process: Preparing the Antalytical Report |
207 |
Newbury |
|
2. Lab EBSD (X, I) |
|
|
|
[Hitachi 4300/EDAX] |
172E |
Kundu |
|
[Scios FIB/EDAX] |
172B |
Michael |
|
3. Lab: SEM/EDS in Forensic Science (A) |
122 |
Platek/Mershon |
|
[Tescan Vega] |
|
|
|
4. Lab: Paired sessions on SEM or EPMA with student samples (sign up) |
|
staff |
|
|
|
|
9:30-9:45 |
Break |
|
|
|
|
|
|
9:45-10:45 |
1. Course Summary: Strategies for Practical Microscopy and Microanalysis |
303 |
J.H.Scott |
|
2. SEM Analysis of Fracture Surfaces (I, A) |
207 |
Hertzberg |
|
3. Lab: Paired sessions on SEM or EPMA with student samples (sign up) |
|
staff |
|
|
|
|
10:45-11:00 |
Break |
|
|
|
|
|
|
11:00-12:00 |
1. Course Summary: Strategies for Practical Microscopy and Microanalysis |
303 |
J.H.Scott |
|
2. Lab: Paired sessions on SEM or EPMA with student samples (sign up) |
|
staff |
|
|
|
|
Afternoon (Choice) |
1:15-2:15 |
1. Failure Analysis in the SEM (X, I, A) |
303 |
Hertzberg |
|
2. Lab: Paired sessions on SEM or EPMA with student samples (sign up) |
|
Staff |