About searching
  1. Focused Ion Beam (FIB)

    Focused Ion Beam (FIB) … The Thermo/FEI Scios located in WH172B focused ion beam (FIB) is primarily for making cross-section …

  2. Course: Focused Ion Beam (FIB): Instrumentation and Applications

    Course: Focused Ion Beam (FIB): Instrumentation and Applications … Each registrant receives the textbook, Introduction to Focused Ion Beam: Instrumentation, Theory, Techniques and …

  3. Materials Characterization Facility (MCF)

    … ChemiSEM Teaching SEM - Hitachi SS3500-N Focused Ion Beam (FIB) - FEI Scios FIB Research Electron Probe …

  4. Low energy ion scattering (LEIS)

    Low energy ion scattering (LEIS) … analysis technique in existence, LEIS uses a low energy beam of He or Ne ions to probe the top atomic layer of a … 3-10 keV He or Ne ions are focused onto the surface of a sample. A toroidal analyzer …

  5. Lehigh Microscopy School

    … Scanning Electron Microscopy ( SEM) Focused Ion Beam ( FIB ) techniques                       …

  6. Microscopy School Textbooks and Course Materials

    … Kluwer/Springer Publishers, New York Introduction to Focused Ion Beam: Instrumentation, Theory, Techniques, and …

  7. About LMS

    … Transmission Electron Microscopy, X-ray Microanalysis, Focused Ion Beam (FIB) Instrumentation and Applications, and …

Back to Home page Get LTS Help