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Focused Ion Beam (FIB)
Focused Ion Beam (FIB) … The Thermo/FEI Scios located in WH172B focused ion beam (FIB) is primarily for making cross-section …
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Course: Focused Ion Beam (FIB): Instrumentation and Applications
Course: Focused Ion Beam (FIB): Instrumentation and Applications … Each registrant receives the textbook, Introduction to Focused Ion Beam: Instrumentation, Theory, Techniques and …
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Materials Characterization Facility (MCF)
… ChemiSEM Teaching SEM - Hitachi SS3500-N Focused Ion Beam (FIB) - FEI Scios FIB Research Electron Probe …
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Low energy ion scattering (LEIS)
Low energy ion scattering (LEIS) … analysis technique in existence, LEIS uses a low energy beam of He or Ne ions to probe the top atomic layer of a … 3-10 keV He or Ne ions are focused onto the surface of a sample. A toroidal analyzer …
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Lehigh Microscopy School
… Scanning Electron Microscopy ( SEM) Focused Ion Beam ( FIB ) techniques …
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Microscopy School Textbooks and Course Materials
… Kluwer/Springer Publishers, New York Introduction to Focused Ion Beam: Instrumentation, Theory, Techniques, and …
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About LMS
… Transmission Electron Microscopy, X-ray Microanalysis, Focused Ion Beam (FIB) Instrumentation and Applications, and …