The majority of electron microscopy and surface science facilities are now open to Lehigh internal users and that we are performing service work for external users.
Equipment Descriptions:
- Research (S)TEM - Jeol ARM 200CF
- Research TEM - Jeol 2100
- Teaching TEM - Jeol 1200EX
- Focused Ion Beam (FIB) - FEI Scios FIB
- Research FEG-SEM - Hitachi 4300 SE/N
- Research FEG-SEM - Zeiss LEO 1550
- Research Electron Probe Micro-Analyzer (EPMA) - JEOL 8900 Superprobe
- Research Environmental SEM - Philips XL30
- Teaching SEM - Hitachi SS3500-N
- Specimen Preparation Facilities
Contact information:
Rob Keyse, TEM Manager
610-758-3465
Leslie O'Brien, SEM Manager
610-758-4283
Lehigh Electron Microscopy
Whitaker Laboratory, 5 East Packer Ave., Bethlehem, PA 18015